JPH0620143Y2 - 検査回路 - Google Patents

検査回路

Info

Publication number
JPH0620143Y2
JPH0620143Y2 JP17116488U JP17116488U JPH0620143Y2 JP H0620143 Y2 JPH0620143 Y2 JP H0620143Y2 JP 17116488 U JP17116488 U JP 17116488U JP 17116488 U JP17116488 U JP 17116488U JP H0620143 Y2 JPH0620143 Y2 JP H0620143Y2
Authority
JP
Japan
Prior art keywords
line
signal
main device
connector
lines
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP17116488U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0291973U (en]
Inventor
裕一 小平
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Priority to JP17116488U priority Critical patent/JPH0620143Y2/ja
Publication of JPH0291973U publication Critical patent/JPH0291973U/ja
Application granted granted Critical
Publication of JPH0620143Y2 publication Critical patent/JPH0620143Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Test And Diagnosis Of Digital Computers (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP17116488U 1988-12-29 1988-12-29 検査回路 Expired - Lifetime JPH0620143Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17116488U JPH0620143Y2 (ja) 1988-12-29 1988-12-29 検査回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17116488U JPH0620143Y2 (ja) 1988-12-29 1988-12-29 検査回路

Publications (2)

Publication Number Publication Date
JPH0291973U JPH0291973U (en]) 1990-07-20
JPH0620143Y2 true JPH0620143Y2 (ja) 1994-05-25

Family

ID=31462751

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17116488U Expired - Lifetime JPH0620143Y2 (ja) 1988-12-29 1988-12-29 検査回路

Country Status (1)

Country Link
JP (1) JPH0620143Y2 (en])

Also Published As

Publication number Publication date
JPH0291973U (en]) 1990-07-20

Similar Documents

Publication Publication Date Title
JPH0620143Y2 (ja) 検査回路
US20100145672A1 (en) Microcomputer and embedded software development system
JPH0120700Y2 (en])
US6738940B1 (en) Integrated circuit including a test signal generator
JP3175344B2 (ja) 故障検出回路
JPH1090360A (ja) Lsi端子のショート/オープン検査装置
JP3195670B2 (ja) 測定装置におけるアンプユニットのチェック方法
JPH07109844B2 (ja) 半導体集積回路
JPH0329752Y2 (en])
JPS6217727Y2 (en])
KR100779824B1 (ko) Lcd 모듈 pcb 검사장치 및 디스플레이 신호 검사방법
JP2595263B2 (ja) テストパターン自動作成方式
JPH0540457Y2 (en])
JPS63265181A (ja) フアンクシヨンテスタ
JP2996989B2 (ja) Icテスターのピン電流測定回路及びその基板
JPH0637781U (ja) プルアップ抵抗の検査装置
JPH09101330A (ja) プルアップ抵抗及びプルダウン抵抗の自動試験器
JPH0338710Y2 (en])
JPH01265353A (ja) プロセッサ集積回路装置
JPH04190177A (ja) 回路基板の検査方法
JP2000028667A (ja) マイコンを備えた電子ユニットの検査装置
JPS6384344A (ja) 異常フレ−ム処理検査方式
JPH02148229A (ja) Cpuを含む電子機器の自己診断システム
JPS60147127A (ja) 内部信号テスト回路付集積回路
JPS5853839A (ja) 集積回路